METROLOGY

Metrology is a critical part of Greenlight’s ability to consistently produce high performing optical components and assemblies.

Greenlight Optics metrology capability includes a Zygo white light interferometer for measurement of surface finish and microstructures, Taylor Hobson PGI Freeform and Taylor Hobson Talysurf profilometers for freeforms and aspheric profiles, and a Zeiss CMM with surface scanning capability and sub-micron accuracy.